Direct Observation of a Semiconductor/Liquid Junction by Operando X-Ray Photoelectron Spectroscopy (XPS)
We demonstrated that the operando
Significance & impact
Top: Diagram of the Operando XPS experiment.
Bottom: (a) XPS peak positions of O 1s and
Operandoambient-pressure XPS was used to directly characterize the semiconductor/liquid junction at room temperature under real-time electrochemical control.
- The use of tender X-rays allowed for the direct evaluation of the energetics for the electrode surface, the electrochemical double layer, and the adjacent bulk water.
- TiO2-protected p+–Si, prepared by Atomic Layer Deposition (ALD), was used in 1.0 M KO